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T6 EVO Series provides the advantages of both 3D laser inspection & 2D vision inspection. It is absolutely the best choice for customers. |
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MPT1000 is Chapman Instruments’ latest noncontact system, providing wafer thickness measurements.Specially designed for final backgrind wafers, it can be used as a production tool for in-line quality inspection, a research and development tool for establishing standards, and compiling data for enhancing productivity. |
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MPS is Chapman Instruments’ next generation of noncontact surface profiler with primary focus on matching future requirements of the wafer manufacturing industry the system was redesigned for more effecient wafer surface measurements and analysis. |
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Chapman Instruments was founded in 1989 with a simple mission - to design, market and support the world's finest optical, non-contact instruments for topography measurements of critical surfaces (i.e. computer disk media, semiconductor wafers, optical lenses etc.) Instantly embraced by the computer disk industry where specific surface features are required, Chapman has become a leader in computer disk surface profiling.
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Gravity-Feed Electrical Test, Vision Inspection, & Taping System |
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